NUP2105L Datasheet by ON Semiconductor

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0N Semiconductor® www.0nseml.com
Semiconductor Components Industries, LLC, 2003
October, 2017 Rev. 9
1Publication Order Number:
NUP2105L/D
NUP2105L, SZNUP2105L
ESD Protection Diode
Dual Line CAN Bus Protector
The SZ/NUP2105L has been designed to protect the CAN
transceiver in highspeed and fault tolerant networks from ESD and
other harmful transient voltage events. This device provides
bidirectional protection for each data line with a single compact
SOT23 package, giving the system designer a low cost option for
improving system reliability and meeting stringent EMI requirements.
Features
350 W Peak Power Dissipation per Line (8/20 msec Waveform)
Low Reverse Leakage Current (< 100 nA)
Low Capacitance HighSpeed CAN Data Rates
IEC Compatibility: IEC 6100042 (ESD): Level 4, 30 kV
IEC 6100044 (EFT): 40 A – 5/50 ns
IEC 6100045 (Lighting) 8.0 A (8/20 ms)
ISO 76372 Pulse 2a: Repetitive Load Switch Disconnect, 9.5 A
ISO 76373 Pulse 3a,b: Repetitive Load Switching Fast Transients,
50 A
Flammability Rating UL 94 V0
SZ Prefix for Automotive and Other Applications Requiring Unique
Site and Control Change Requirements; AECQ101 Qualified and
PPAP Capable
These Devices are PbFree, Halogen Free/BFR Free and are RoHS
Compliant
Applications
Industrial Control Networks
Smart Distribution Systems (SDS)
DeviceNet
Automotive Networks
Low and HighSpeed CAN
Fault Tolerant CAN
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SOT23
CASE 318
STYLE 27
PIN 1
PIN 3
PIN 2
MARKING DIAGRAM
27E = Device Code
M = Date Code
G= PbFree Package
SOT23
DUAL BIDIRECTIONAL
VOLTAGE SUPPRESSOR
350 W PEAK POWER
1
27EMG
G
CAN
Transceiver
CAN_H
CAN_L
NUP2105L
CAN Bus
See detailed ordering and shipping information in the package
dimensions section on page 2 of this data sheet.
ORDERING INFORMATION
(Note: Microdot may be in either location)
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NUP2105L, SZNUP2105L
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2
MAXIMUM RATINGS (TJ = 25°C, unless otherwise specified)
Symbol Rating Value Unit
PPK Peak Power Dissipation
8/20 ms Double Exponential Waveform (Note 1) 350
W
TJOperating Junction Temperature Range 55 to 150 °C
TJStorage Temperature Range 55 to 150 °C
TLLead Solder Temperature (10 s) 260 °C
ESD Human Body model (HBM)
Machine Model (MM)
IEC 6100042 Specification (Contact)
16
400
30
kV
V
kV
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Nonrepetitive current pulse per Figure 1.
ELECTRICAL CHARACTERISTICS (TJ = 25°C, unless otherwise specified)
Symbol Parameter Test Conditions Min Typ Max Unit
VRWM Reverse Working Voltage (Note 2) 24 V
VBR Breakdown Voltage IT = 1 mA (Note 3) 26.2 32 V
IRReverse Leakage Current VRWM = 24 V 1.5 100 nA
VCClamping Voltage IPP = 5 A (8/20 ms Waveform)
(Note 4)
40 V
VCClamping Voltage IPP = 8 A (8/20 ms Waveform)
(Note 4)
44 V
IPP Maximum Peak Pulse Current 8/20 ms Waveform (Note 4) 8.0 A
CJ Capacitance VR = 0 V, f = 1 MHz (Line to GND) 30 pF
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
2. Surge protection devices are normally selected according to the working peak reverse voltage (VRWM), which should be equal or greater
than the DC or continuous peak operating voltage level.
3. VBR is measured at pulse test current IT
.
4. Pulse waveform per Figure 1.
ORDERING INFORMATION
Device Package Shipping
NUP2105LT1G SOT23
(PbFree)
3,000 / Tape & Reel
SZNUP2105LT1G* SOT23
(PbFree)
3,000 / Tape & Reel
NUP2105LT3G SOT23
(PbFree)
10,000 / Tape & Reel
SZNUP2105LT3G* SOT23
(PbFree)
10,000 / Tape & Reel
For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
*SZ Prefix for Automotive and Other Applications Requiring Unique Site and Control Change Requirements; AECQ101 Qualified and PPAP
Capable
125°C
NUP2105L, SZNUP2105L
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3
TYPICAL PERFORMANCE CURVES
(TJ = 25°C unless otherwise noted)
Figure 1. Pulse Waveform, IEC 6100045 8/20 ms
110
90
80
70
60
50
40
30
20
10
00 5 15 25
t, TIME (ms)
% OF PEAK PULSE CURRENT
WAVEFORM
PARAMETERS
tr = 8 ms
td = 20 ms
td = IPP/2
30
Figure 2. Clamping Voltage vs Peak Pulse Current
12.0
10.0
8.0
6.0
4.0
2.0
0.025 40
VC, CLAMPING VOLTAGE (V)
IPP
, PEAK PULSE CURRENT (A)
30 35 45 50
100
10 20
ct
Figure 3. Typical Junction Capacitance vs
Reverse Voltage
25
02
VR, REVERSE VOLTAGE (V)
C, CAPACITANCE (pF)
46810
125°C
20
15
35
10
30
25°C
40°C
PULSE WAVEFORM
8 x 20 ms per Figure 1
f = 1.0 MHz, Line to Ground
0
5
10
15
20
25
30
35
40
45
50
20 22 24 26 28 30 32 34
Figure 4. VBR versus IT Characteristics
55°C
TA = +150°C
25°C
65°C
VBR, VOLTAGE (V)
IT
, (mA)
Figure 5. IR versus Temperature Characteristics
0
5
10
15
20
25
024681012
IL, LEAKAGE CURRENT (nA)
VR, REVERSE BIAS VOLTAGE (V)
0
20
40
60
80
100
120
60 30 0 30 60 90 120 150 180
Figure 6. Temperature Power Dissipation Derating
TEMPERATURE (°C)
PERCENT DERATING (%)
14 16
25°C, 55°C
TA = 150°C
125°C
65°C
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NUP2105L, SZNUP2105L
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4
APPLICATIONS
Background
The Controller Area Network (CAN) is a serial
communication protocol designed for providing reliable
high speed data transmission in harsh environments. surge
protection diodes provide a low cost solution to conducted
and radiated Electromagnetic Interference (EMI) and
Electrostatic Discharge (ESD) noise problems. The noise
immunity level and reliability of CAN transceivers can be
easily increased by adding external surge protection diodes
to prevent transient voltage failures.
The NUP2105L provides a surge protection solution for
CAN data communication lines. The NUP2105L is a dual
bidirectional surge protection device in a compact
SOT23 package. This device is based on Zener technology
that optimizes the active area of a PN junction to provide
robust protection against transient EMI surge voltage and
ESD. The NUP2105L has been tested to EMI and ESD
levels that exceed the specifications of popular high speed
CAN networks.
CAN Physical Layer Requirements
Table 1 provides a summary of the system requirements
for a CAN transceiver. The ISO 118982 physical layer
specification forms the baseline for most CAN systems. The
transceiver requirements for the Honeywell Smart
Distribution Systems (SDS) and Rockwell
(AllenBradley) DeviceNet high speed CAN networks
are similar to ISO 118982. The SDS and DeviceNet
transceiver requirements are similar to ISO 118982;
however, they include minor modifications required in an
industrial environment.
Table 1. Transceiver Requirements for HighSpeed CAN Networks
Parameter ISO 118982SDS Physical Layer
Specification 2.0
DeviceNet
Min / Max Bus Voltage
(12 V System)
3.0 V / 16 V 11 V / 25 V Same as ISO 118982
Common Mode Bus Voltage CAN_L:
2.0 V (min)
2.5 V (nom)
CAN_H:
2.5 V (nom)
7.0 V (max)
Same as ISO 118982Same as ISO 118982
Transmission Speed 1.0 Mb/s @ 40 m
125 kb/s @ 500 m
Same as ISO 118982500 kb/s @ 100 m
125 kb/s @ 500 m
ESD Not specified, recommended
w $8.0 kV (contact)
Not specified, recommended
w $8.0 kV (contact)
Not specified, recommended
w $8.0 kV (contact)
EMI Immunity ISO 76373, pulses ‘a’ and ‘b’ IEC 6100044 EFT Same as ISO 118982
Popular Applications Automotive, Truck, Medical
and Marine Systems
Industrial Control Systems Industrial Control Systems
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NUP2105L, SZNUP2105L
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5
EMI Specifications
The EMI protection level provided by the surge protection
device can be measured using the International Organization
for Standardization (ISO) 76372 and 3 specifications that
are representative of various noise sources. The ISO 76372
specification is used to define the susceptibility to coupled
transient noise on a 12 V power supply, while ISO 76373
defines the noise immunity tests for data lines. The ISO 7637
tests also verify the robustness and reliability of a design by
applying the surge voltage for extended durations.
The IEC 610004X specifications can also be used to
quantify the EMI immunity level of a CAN system. The IEC
610004 and ISO 7637 tests are similar; however, the IEC
standard was created as a generic test for any electronic
system, while the ISO 7637 standard was designed for
vehicular applications. The IEC6100044 Electrical Fast
Transient (EFT) specification is similar to the ISO 76373
pulse 3a and b tests and is a requirement of SDS CAN
systems. The IEC 6100045 test is used to define the power
absorption capacity of a surge protection device and long
duration voltage transients such as lightning. Table 2
provides a summary of the ISO 7637 and IEC 610004X
test specifications. Table 3 provides the NUP2105Ls ESD
test results.
Table 2. ISO 7637 and IEC 610004X Test Specifications
Test Waveform Test Specifications NUP2105L Results Simulated Noise Source
ISO 76372
12 V Power Supply Lines
(Note 2)
Pulse 1
Vs = 0 to 100 V
Imax = 10 A
tduration = 5000 pulses
Imax = 1.75 A
Vclamp_max = 31 V
tduration = 5000 pulses
Ri = 10 W, tr = 1.0 ms,
td_10% = 2000 ms, t1 = 2.5 s,
t2 = 200 ms, t3 = 100 ms
DUT (Note 1) in parallel with
inductive load that is
disconnected from power
supply.
Pulse 2a
Vs = 0 to +50 V
coupled onto 14 V battery
Imax = 10 A
tduration = 5000 pulses
Imax = 9.5 A
Vclamp_max = 42 V
tduration = 5000 pulses
Ri = 2 W, tr = 1.0 ms,
td_10% = 50 ms, t1 = 2.5 s,
t2 = 200 ms
DUT in series with inductor
(wire harness) that is
disconnected from load.
ISO 76373
Repetitive data line fast
transients (Note 3)
Pulse ‘a’
Vs = 60 V
Imax = 1.2 A
tduration = 10 minutes
Imax = 50 A (Note 4)
Vclamp_max = 40 V
tduration = 60 minutes
Ri = 50 W, tr = 5.0 ns,
td_10% = 100 ns, t1 = 100 ms,
t2 = 10 ms, t3 = 90 ms
Switching noise of inductive
loads.
Pulse ‘b’
Vs = +40 V
Imax = 0.8 A
tduration = 10 minutes
IEC 6100044
Data Line EFT
Vopen circuit = 2.0 kV
Ishort circuit = 40 A
(Level 4 = Severe Industrial
Environment)
Ri = 50 W, tr < 5.0 ns,
td_50% = 50 ns, tburst = 15 ms,
fburst = 2.0 to 5.0 kHz,
trepeat = 300 ms
tduration = 1 minute
(Note 5) Switching noise of inductive
loads.
IEC 6100045
Vopen circuit = 1.2/50 ms,
Ishort circuit = 8/20 ms
Ri = 50 W
Imax = 8.0 A Lightning, nonrepetitive
power line and load
switching
1. DUT = device under test.
2. Test specifications were taken from ISO76372: 2004 version.
3. Test specifications were taken from ISO76373: 1995 version.
4. DUT was tested to ISO76372: 2004 pulse 3a,b specification for more rigorous test.
5. The EFT immunity level was measured with test limits beyond the IEC 6100044 test, but with the more severe test conditions of
ISO 76373.
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6
Table 3. NUP2105L ESD Test Results
ESD Specification Test Test Level Pass / Fail
Human Body Model Contact 16 kV Pass
IEC 6100042
Contact 30 kV (Note 6) Pass
Noncontact (Air Discharge) 30 kV (Note 6) Pass
6. Test equipment maximum test voltage is 30 kV.
Surge protection Diode Protection Circuit
surge protection diodes provide protection to a
transceiver by clamping a surge voltage to a safe level. surge
protection diodes have high impedance below and low
impedance above their breakdown voltage. A surge
protection Zener diode has its junction optimized to absorb
the high peak energy of a transient event, while a standard
Zener diode is designed and specified to clamp a
steady state voltage.
Figure 7 provides an example of a dual bidirectional surge
protection diode array that can be used for protection with
the highspeed CAN network. The bidirectional array is
created from four identical Zener surge protection diodes.
The clamping voltage of the composite device is equal to the
breakdown voltage of the diode that is reversed biased, plus
the diode drop of the second diode that is forwarded biased.
Figure 7. HighSpeed and Fault Tolerant CAN Surge
Protection Circuit
CAN
Transceiver
CAN_H
CAN_L
NUP2105L
CAN Bus
+ —\ 1—‘7 ~ + 3E%i EL AF i F 2 n fig SOLDERING FOOTPRINT“
NUP2105L, SZNUP2105L
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7
PACKAGE DIMENSIONS
SOT23 (TO236)
CASE 31808
ISSUE AR
D
A1
3
12
NOTES:
1. DIMENSIONING AND TOLERANCING PER ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
3. MAXIMUM LEAD THICKNESS INCLUDES LEAD FINISH.
MINIMUM LEAD THICKNESS IS THE MINIMUM THICKNESS OF
THE BASE MATERIAL.
4. DIMENSIONS D AND E DO NOT INCLUDE MOLD FLASH,
PROTRUSIONS, OR GATE BURRS.
SOLDERING FOOTPRINT*
VIEW C
L
0.25
L1
e
EE
b
A
SEE VIEW C
DIM
A
MIN NOM MAX MIN
MILLIMETERS
0.89 1.00 1.11 0.035
INCHES
A1 0.01 0.06 0.10 0.000
b0.37 0.44 0.50 0.015
c0.08 0.14 0.20 0.003
D2.80 2.90 3.04 0.110
E1.20 1.30 1.40 0.047
e1.78 1.90 2.04 0.070
L0.30 0.43 0.55 0.012
0.039 0.044
0.002 0.004
0.017 0.020
0.006 0.008
0.114 0.120
0.051 0.055
0.075 0.080
0.017 0.022
NOM MAX
L1
H
2.10 2.40 2.64 0.083 0.094 0.104
HE
0.35 0.54 0.69 0.014 0.021 0.027
c
0−−− 10 0 −−− 10
T°°°°
T
3X
TOP VIEW
SIDE VIEW
END VIEW
2.90
0.80
DIMENSIONS: MILLIMETERS
0.90
PITCH
3X
3X 0.95
RECOMMENDED
*For additional information on our PbFree strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
STYLE 27:
PIN 1. CATHODE
2. CATHODE
3. CATHODE
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USA/Canada
Europe, Middle East and Africa Technical Support:
Phone: 421 33 790 2910
Japan Customer Focus Center
Phone: 81358171050
NUP2105L/D
Honeywell and SDS are registered trademarks of Honeywell International Inc.
DeviceNet is a trademark of Rockwell Automation.
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