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EPCDESIGNTOOL Gallium Nitride (GaN) FET Design Tools

EPC's design tools are mechanical dies ideal for electromigration and daisy-chain testing

Image of EPC's EPCDESIGNTOOL GaN FET Design ToolEPC's EPCDESIGNTOOL devices are ideal for daisy-chain and electromigration testing. A variety of die sizes are available. Electromigration test devices have internal metal layers shorted for electromigration reliability testing.

Daisy-chain test devices are suitable for a wide variety of process-related testing including life cycle testing, drop testing, thermal testing, and optimizing the assembly process.

Features
  • Electromigration test devices:
    • Internal metal layers shorted for electromigration reliability testing
  • Daisy-chain test devices:
    • Suitable for a wide variety of process-related testing including life cycle testing, drop testing, thermal testing, and optimizing the assembly process
    • Daisy-chained packages are wired to provide a continuous path through the package for easy testing

EPCDESIGNTOOL GaN FET Design Tools

ImageManufacturer Part NumberDescriptionAvailable QuantityView Details
ENGR DIE FOR ELECTROMIGRATIONEPCDESIGNTOOL_MD-EMENGR DIE FOR ELECTROMIGRATION5 - ImmediateView Details
ENGR DIE FOR ELECTROMIGRAMEPCDESIGNTOOL_XL-EMENGR DIE FOR ELECTROMIGRAM200 - ImmediateView Details
ENGR DIE ELECTROMIGRATIONEPCDESIGNTOOL_LG-EMENGR DIE ELECTROMIGRATION200 - ImmediateView Details
ENGR DIE FOR DAISY CHAINEPCDESIGNTOOL_RP-DCENGR DIE FOR DAISY CHAIN150 - ImmediateView Details
ENGR DIE FOR DAISY CHAINEPCDESIGNTOOL_XL-DCENGR DIE FOR DAISY CHAIN130 - ImmediateView Details
Published: 2019-01-09